AR-P 5300 series product brief 產品說明
AR-P 5300系列產品為高敏感度正型光阻,適合電極等金屬蒸鍍懸浮剝離(lift-off)製程。
目前產品依配方與厚度範圍有如下序號:

Packing & shipping 產品包裝與出貨

packing 產品包裝

✅ 250 ml/瓶

✅ 1 L/瓶

其它包裝可依需求研擬增加

shipping 產品出貨

✅ 2 – 4 週。德國運出。(AR-P 5350)

❎ 1 週。國內庫存。 (目前無國內庫存)

AR-P 5320 無固定生產排程,需先詢問。

Product features 產品特性

  • broadband UV, i-line, g-line
    曝光波長: 寬頻紫外線, i-line (365nm) , g-line (436nm)
  • high photosensitivity, high resolution
    高敏感度,高解析度
  • good adhesion properties
    與基板介面接著度良好
  • undercut structures for vapor deposition application, in particular of metal using lift-off techniques e.g., conductor paths
    下切結構適合金屬電極等蒸鍍及浮剝離技術
  • plasma etching resistant, temperature-stable up to 120 °C
    耐電漿蝕刻,耐溫可達120℃
  • combination of novolac and naphthoquinone diazide
    主要成份為酚醛樹酯及叠氮基萘醌
  • safer solvent PGMEA
    使用較安全溶劑丙二醇甲醚醋酸酯

Product properties 產品物性

AR-P 5300 series Spin curve 塗佈曲線

Structure and resolution 結構與解析度

Structure resolution

AR-P 5350
Lift-off resist structure after metal evaporation

Resist structure

AR-P 5320
Lift-off resist structure after development

Process parameters

SubstrateSi 4″ wafer
Soft bake105℃ x 4min, hot plate
Exposureg-line stepper (NA: 0.56)
DevelopmentAR 300-35, 1:2, 60 sec, 22℃

Process chemicals

Adhesion promoterAR 300-80
DeveloperAR 300-26 / AR 300-35
ThinnerAR 300-12
RemoverAR 300-76 / AR 600-71

Process baseline 製程參數

This diagram shows exemplary process steps for AR-P 5300 series resists. All specifications are guideline values which must be adapted to own specific conditions. For further information on processing, 👉“ Detailed instructions for optimum processing of photoresists”. For recommendations on wastewater treatment and general safety instructions, 👉”General product information on Allresist photoresists”.
表列為AR-P 5300系列產品製程參數的範例。所有參數為參考值,使用者應依設備環境實際狀況加以調整。

Process instructions

Tempering 軟烤

Higher tempering temperatures are required to produce the undercut
形成下切式結構需較高的軟烤溫度

Development 顯影

The undercut of resist structures is generated during aqueous-alkaline development
下切式結構是在鹼性水溶液顯影程序下形成

Development recipe

ResistDeveloper
AR 300-26AR 300-35AR 300-47
AR-P 53202 : 1 to 3 : 2 (1-3 min)– –– –
AR-P 53501 : 71 : 22 : 3

Contents are base on principal’s product TDS
內容取材自原廠產品技術資料