X AR 600-60/1 stopper

For stopping the protective coating SX AR-PC 5000/41 after development with X AR 300-74/1

X AR 600-60/1 Product brief 產品簡介

顯影抑制劑主要用於電子束微影或保護塗佈的顯影製程,可使顯影製程中斷,避免過度顯影或殘留顯影劑造成製程瑕疵。亦可於顯影劑中加入10-20%以降低顯影速率。
系列產品中X AR 600-60/1主要用於下述保護塗層的顯影抑制:
SX AR-PC 5000/41 protection coating

說明:SX AR-PC 5000/41為耐高濃度HF (氫氟酸)與KOH(氫氧化鉀)蝕刻的保護塗層;詳細製程請前往產品參考。

Packing 產品包裝:
✅ 1  L/瓶

其它包裝可依客戶需求增加.

Shipping 出貨:

✅ 2 – 4 週。德國出貨。

❎ 1 週。國內庫存。

(本產品暫無國內庫存)

Product Features 產品特性

  • immediate interruption of the development process
    可立即中斷顯影製程
  • High-purity solvent mixture for residue-free removal of developer residues from X AR 300-74/1
    高純度混合溶劑,可有效的去除顯影劑X AR 300-74/1的殘留。
  • The development process can be slowed down by adding 10-20 % of the stopper X AR 600-60/1 to the developer X AR 300-74/1
    於顯影劑中加入10-20%顯影抑制劑可降低顯影速率。

Product properties 產品物性

X AR 600-60/1
Main components 主要成分Octane 正辛烷
Density at 20℃ (g/cm3) 密度0.703
Refractive index at 20℃ 折射率
Water content max. 最大含水量(%)
Non-volatiles max. 非揮發成份(%)
Flash point (℃) 閃火點13
Filtration 過濾規格(um)0.2
Storage 6 months 儲存溫度( ℃)10 – 22

Dedicated stopper for resist 適用阻劑

AR Stopper family introduction 系列阻劑去除劑說明

Stopper
Properties
AR 600-60AR 600-61X AR 600-60/1
Main components 主要成分
異丙醇二乙二醇丁醚正辛烷
Density at 20℃ (g/cm3) 密度
0.785x0.9640.703
Refractive index at 20℃折射率
1.4021.517
Water content max. 最大含水量%
0.120
Non-volatiles max. 非揮發成份(%)
0.0020.002
Flash point (℃) 閃火點
1210513
Filtration 過濾規格(um)
0.2
Production status 生產排程1
routine1on-demandroutine
Lead time 交期
2 – 4 週
Product packing 產品包裝
1 L/瓶
Storage 6 months 儲存溫度( ℃)
10 – 2210 -2 210 – 22
GHS label GHS標識
Stopper for PMMA EBL resist
Stopper for AR-P 617 EBL resist
Stopper for AR-P 6200 EBL resist
Stopper for AR-P 6510 EBL resist
Stopper for AR-P 4600 photoresist
Stopper for AR-PC 5000/41
Remark:
1. routine: 固定排程生產,交期約2-4週。
   on-demand: 無固定排程生產,價格需先詢問。可能有最低採購量要求。

Information on stopper process 顯影抑製劑相關資訊:

The addition of stopper for approximately 30 s after development interrupts the development process and leads to a rapid rinsing of residual developer.
Due the processing regime however, constantly developer is transferred into the stopper bath. Already small amounts of the developer will affect the efficiency of the stopping process. It is thus highly recommended to constantly exchange the stopper or to use two stopper baths which are arranged consecutively.
If 10-20 % of stopper AR 600-60 is added to developers AR 600-50, 600-55 and 600-56, the development process is slowed down.
If the stopper AR 600-60 is used for developers AR-P 630-670, higher contrast values up to 10 are possible, while the sensitivity of the PMMA resists is at the same time decreased. Higher exposure doses and prolonged development times are thus required in this case.

加入抑制劑約30秒後, 會中斷顯影且導致快速增加的顯影液殘留。
規律的製程會使顯影液不斷的被帶入抑制槽,,少量的顯影液就會降低抑制效果。 建議經常性的更換槽液,,或者使用雙抑制槽的設計。
在AR 600-50,AR 600-55及AR 600-56等顯影液加入20%的AR 600-60 stopper可降低顯影速率。
AR 600-60 stopper用於AR-P 630-670 PMMA EBL resist,可使對比提高到10;但同時也會降低敏感度。  這種情況下,建議提高曝光劑量及延長顯影時間。

Contents are base on principal’s product TDS
內容取材自原廠產品技術資料